22 Aug
|
Go Global Technologies
|
India
22 Aug
Go Global Technologies
India
Job Summary
We're hiring a DFT Lead to own ASIC/SoC test strategy, with a core focus on MBIST and ATPG You'll drive DFT architecture from RTL through tapeout, partner closely with design and physical design teams, and help push our silicon toward best-in-class test coverage and quality.
Responsibilities
- Own DFT strategy for one or more SoC/ASIC projects: scan architecture, MBIST, and ATPG
- Architect and debug MBIST for embedded memories (SRAM, ROM, register files), including repair/BISR
- Define scan chains and generate high-coverage ATPG patterns (stuck-at, transition, cell-aware)
- Partner with RTL and physical design teams to resolve DFT-related timing/congestion issues
- Drive DFT sign-off: fault grading, coverage analysis, gate-level pattern validation
- Support boundary scan (JTAG) and IJTAG test access infrastructure
- Work with test engineering on ATE pattern bring-up and silicon debug
- Automate DFT flows via Perl/Python/TCL scripting
- Mentor junior DFT engineers and improve team DFT methodology
Qualifications
- BS/MS in EE, CE, or related field
- 5+ years of hands-on DFT experience, with robust expertise in MBIST and ATPG
- Hands-on with Synopsys DFT Compiler/TestMAX, Tessent, or Cadence Modus
- Experience with memory BIST/BISR and memory IP/compilers
- Familiarity with JTAG/IJTAG test access standards
- Solid digital design fundamentals (combinational/sequential logic, basic STA)
- Scripting proficiency (Perl/Python/TCL)
- Gate-level simulation experience for pattern validation
- Strong communication and cross-functional collaboration skills.
Nice to Have
- Power-aware DFT / low-power scan experience
- Advanced node experience (7nm and below)
- ATE test program bring-up exposure
Pay: Up to ₹100,000.00 per month
Work Location: In person
📌 Design for Testability Lead (DFT) (India)
🏢 Go Global Technologies
📍 India