Role Description

Scan & ATPG

Strong understanding of Siemens Tessent Tools for ATPG with SSN methodology
Experience in ICL, PDL, Stuck-at and transition fault pattern generation
Good understanding on scan coverage and experience in carrying out coverage analysis.
Experience in Timing and no Timing gate level simulations and debugging simulation failures.
Experience in carrying out DFT DRC checks in RTL and analyzing the violations.
Solid understanding of Scan structures, IEEE1149.1, IEEE1687, ATPG methodology and flow.
Good understanding of timing constraints, synthesis flow and scan insertion using DC/FC
Strong TCL/scripting knowledge MBIST
Strong understanding of Siemens Tessent tools for MBIST insertion and verification
Experience in MBIST insertion in RTL, pattern generation.
Experience in ICL, PDL, IEEE1149.1,



IEEE1687, MBIST verification and debugging simulation failures.
Good understanding of MBIST algorithms, architecture, and diagnosis features
Strong TCL/scripting knowledge Verification
Strong knowledge on ICL, PDL, IEEE1149.1, IEEE1687, Simulations tools such VCS
Experience in creation of DFT test bench structures, verifying DFX structures in RTL and debugging simulation failures.
Good understanding of DFT structures such as scan controller, OCC, EDT, JTAG, iJTAG, IOs, HSIO loopback, reset controller.
Strong TCL/scripting knowledge

Skills

DFT, JTAG, Logic Synthesis, Siemens Tessent

📌 Associate III (Bengaluru)
🏢 UST
📍 Bengaluru