- Lead development of iJTAG (IEEE 1687) based test solutions, including scan network modeling, instrument access, and test pattern execution.
- Design and implement DFT methodologies including scan, BIST, and hierarchical access mechanisms.
- Build AI/ML features in DFT tools for pattern compaction, failure prediction, and scan-failure root-cause analysis
- Develop scalable automation frameworks in Python/C++ and streamline DFT workflows using Tcl/Perl/Shell

• Build APIs and pipelines for Large-scale data ingestion (ATE logs, STIL/WGL patterns) and data processing and visualization dashboards

BE/ME Computer Science, Electronics Engineering or related professions with at least 2-5 years working experience in software development

- Understanding of Basic DFT concepts (scan chains, testability basics) and semiconductor testing fundamentals




- Strong programming expertise in C,C++ or Python and experience in data structures, algorithms, and scalable system design in Linux OS
- Strong attention to details, verbal communication and written skill sets, and ability to work with a highly diverse team-structured setting with positive attitude is mandatory
- Ability to work in a fast paced, project oriented, team environment and escalate any critical issues to the senior management.

Desired

- Exposure to ATE platforms (V93000 or similar) Linux-based development
- Basic knowledge of iJTAG / IEEE 1687 concepts
- Contributions to test optimization/yield improvement frameworks
- Interest or exposure to AI/ML data analysis, automation, or simple ML models applied to test/debug

📌 Application Engineer (India)
🏢 Advantest
📍 India